50X-500X Polarizing Darkfield Metallographic Metallurgical Microscope

This is an advanced reflected-brightfield, darkfield and polarizing metallurgical microscopy system. The microscope comes with a quintuple nosepiece, four infinity Plan objectives and a powerful 100W reflected Koehler illumination system, providing brightfield, darkfield and polarizing features. This microscopy system is perfect for metallurgical labs and foundries for silicon wafer inspection, integrated circuit examination, quality control and R&D applications. It is an ideal instrument for metallurgical, mineral and crystal identification. Features : A brightfield, darkfield and polarizing metallurgical microscopy system with 100W Kohler illumination Color corrected infinity optical system (CCIS) 25 degree inclined 360 degree rotatable gemel trinocular head with vertical image 100% prismatic rate Quintuple nosepiece with brightfield (BF) and darkfield (DF) Five infinity PLAN Achromatic objectives included Eyepiece with 0.1mm micrometer and cross hair included 100 Watt halogen reflected EPI-illumination system Digital controlled intensity adjustment and light reset 6" extremely large mechanical stage with clutch for swift moving control Low position stage traveling controls Full optical glass elements Precise ground glass lenses All metal mechanical parts Coaxial coarse and fine focusing system Dual focusing control knobs Focusing tension control mechanism Adjustable interpupillary distance Adjustable diopters on both eye tubes

• Four levels of metallurgical magnification Settings: 50X, 100X, 200X & 500X
• Four levels of metallurgical magnification Settings: 50X, 100X, 200X & 500X
• Four levels of metallurgical magnification Settings: 50X, 100X, 200X & 500X
• A brightfield, darkfield and polarizing metallurgical microscopy system with 100W Kohler illumination
• Color corrected infinity optical system (CCIS)
• 6" extremely large mechanical stage with clutch for swift moving control
• Quintuple nosepiece with brightfield (BF) and darkfield (DF)